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Plot of RESET R-I curve of e-PCM and conventional PCM devices operated... | Download Scientific Diagram
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Endurance cycle for 200 nm e-PCM device with a self-aligned oxidation... | Download Scientific Diagram
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Endurance characteristic of PCM cells in the array. The inset shows the... | Download Scientific Diagram
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a A characteristic cycling endurance curve for a PCM device showing the... | Download Scientific Diagram
a A characteristic cycling endurance curve for a PCM device showing the... | Download Scientific Diagram
![Figure 5 | Constructing reliable PCM and OTS devices with an interfacial carbon layer | SpringerLink Figure 5 | Constructing reliable PCM and OTS devices with an interfacial carbon layer | SpringerLink](https://media.springernature.com/full/springer-static/image/art%3A10.1007%2Fs10854-019-02373-y/MediaObjects/10854_2019_2373_Fig5_HTML.png)
Figure 5 | Constructing reliable PCM and OTS devices with an interfacial carbon layer | SpringerLink
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Atomic-level engineering of phase change material for novel fast-switching and high-endurance PCM for storage class memory application | Semantic Scholar
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